01871oam 2200469zu 450 991087306210332120210807003343.0(CKB)111085500351320(SSID)ssj0000395465(PQKBManifestationID)12144167(PQKBTitleCode)TC0000395465(PQKBWorkID)10455280(PQKB)11058404(EXLCZ)9911108550035132020160829d2004 uy engtxtccrICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan[Place of publication not identified]IEEE2004Bibliographic Level Mode of Issuance: Monograph0-7803-8262-5 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronic apparatus and appliancesTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingSemiconductorsTestingElectronic apparatus and appliancesTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringIEEE Electron Devices SocietyIEEE International Conference on Microelectronic Test StructuresPQKBPROCEEDING9910873062103321ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan2538029UNINA