02144oam 2200505zu 450 991087297630332120241212215058.0(CKB)111055184223076(SSID)ssj0000395943(PQKBManifestationID)12111723(PQKBTitleCode)TC0000395943(PQKBWorkID)10460474(PQKB)11318333(EXLCZ)9911105518422307620160829d2001 uy engtxtccrInternational Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California[Place of publication not identified]IEEE Computer Society2001Bibliographic Level Mode of Issuance: Monograph9780769510255 0769510256 Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsDesign and constructionVery large scale integrationCongressesIntegrated circuitsComputer-aided designVery large scale integrationCongressesIntegrated circuitsTestingVery large scale integrationQuality controlCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsDesign and constructionVery large scale integrationIntegrated circuitsComputer-aided designVery large scale integrationIntegrated circuitsTestingVery large scale integrationQuality controlElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5IEEE Computer SocietyPQKBPROCEEDING9910872976303321International Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California2400336UNINA