01894oam 2200493zu 450 991087287750332120241212214925.0(CKB)111026746725116(SSID)ssj0000443722(PQKBManifestationID)12121862(PQKBTitleCode)TC0000443722(PQKBWorkID)10473727(PQKB)11015865(EXLCZ)9911102674672511620160829d1999 uy engtxtccr1999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999[Place of publication not identified]IEEE1999Bibliographic Level Mode of Issuance: Monograph9780780354326 078035432X Systems engineeringTestingCongressesElectronic digital computersTechnological innovationsCongressesWeapons systemsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSystems engineeringTestingElectronic digital computersTechnological innovationsWeapons systemsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering629.135Institute of Electrical and Electronics EngineersAutotestcon '99PQKBPROCEEDING99108728775033211999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 19992541977UNINA