01861oam 2200481zu 450 991087284610332120241212214914.0(CKB)111026746720556(SSID)ssj0000454958(PQKBManifestationID)12175359(PQKBTitleCode)TC0000454958(PQKBWorkID)10399245(PQKB)11207244(EXLCZ)9911102674672055620160829d1997 uy engtxtccr1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997[Place of publication not identified]IEEE Electron Devices Society1997Bibliographic Level Mode of Issuance: Monograph9780780342057 0780342054 Integrated circuitsReliabilityCongressesIntegrated circuitsCongressesReliabilityWafer-scale integrationElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsReliabilityCongresses.Integrated circuitsCongressesReliabilityWafer-scale integration.Electrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBBOOK99108728461033211997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 19972539629UNINA