02015oam 2200541zu 450 991087282650332120241212214914.0(CKB)111026746721694(SSID)ssj0000455090(PQKBManifestationID)12149058(PQKBTitleCode)TC0000455090(PQKBWorkID)10398954(PQKB)11087862(EXLCZ)9911102674672169420160829d1998 uy engtxtccr1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah][Place of publication not identified]IEEE1998Bibliographic Level Mode of Issuance: Monograph9780780344204 0780344200 Systems engineeringTestingCongressesAutomatic test equipmentTestingCongressesAvionicsTestingCongressesMilitary suppliesCongressesMotor vehiclesCongressesMechanical EngineeringHILCCMechanical Engineering - GeneralHILCCEngineering & Applied SciencesHILCCSystems engineeringTestingAutomatic test equipmentTestingAvionicsTestingMilitary suppliesMotor vehiclesMechanical EngineeringMechanical Engineering - GeneralEngineering & Applied Sciences670.42/5Institute of Electrical and Electronics Engineers,Autotestcon.PQKBPROCEEDING99108728265033211998 IEEE Autotestcon proceedings : : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : 24-27 August, 1998, Salt Lake City, Utah2544586UNINA