01125nam0 2200301 i 450 SUN010920420170516020211.9430.00N978-3-319-12508-420170516d2015 |0engc50 baengCH|||| |||||*Spinal imaging and image analysisShuo Li, Jianhua Yao, EditorsCham : Springer, 2015X508 p. ; 24 cmPubblicazione in formato elettronico001SUN01084122001 *Lecture Notes in Computational Vision and Biomechanics18210 BerlinSpringer.CHChamSUNL001889Yao, JianhuaSUNV083690Li, ShuoSUNV083693SpringerSUNV000178650ITSOL20200921RICAhttp://link.springer.com/book/10.1007%2F978-3-319-12508-4SUN0109204BIBLIOTECA CENTRO DI SERVIZIO SBA15CONS SBA EBOOK 1192 15EB 1192 20170516 Spinal imaging and image analysis1465852UNICAMPANIA01908oam 2200397zu 450 991087276920332120241212214756.0(CKB)111026746701452(SSID)ssj0000454810(PQKBManifestationID)12192133(PQKBTitleCode)TC0000454810(PQKBWorkID)10399128(PQKB)10966764(NjHacI)99111026746701452(EXLCZ)9911102674670145220160829d2000 uy engur|||||||||||txtccr2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems[Place of publication not identified]IEEE Computer Society Press20001 online resource (438 pages)Bibliographic Level Mode of Issuance: Monograph9780769507194 0769507190 This volume includes 45 papers presented at the October 2000 symposium, covering yield analysis, modeling, and enhancement; fault tolerance interconnections and systems; reconfiguration and repair; error coding; online testing; testing and BIST techniques; and fault injection techniques and environments. The authors, professionals and academics from 18 different companies, offer papers on specific topics such as quality-effective repair of multichip module systems, evaluations of burst error recovery for VF arithmetic coding, and test cost minimization for Hybrid BIST. A thorough subject index is lacking. Annotation copyrighted by Book News, Inc., Portland, OR.Fault-tolerant computingCongressesFault-tolerant computing004.2PQKBPROCEEDING99108727692033212000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems2397761UNINA