01857oam 2200481zu 450 991087274600332120210807003411.0(CKB)111026746738630(SSID)ssj0000396431(PQKBManifestationID)12138768(PQKBTitleCode)TC0000396431(PQKBWorkID)10465039(PQKB)11504310(EXLCZ)9911102674673863020160829d1994 uy engtxtccrRecords of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California[Place of publication not identified]IEEE Computer Society Press1994Bibliographic Level Mode of Issuance: Monograph0-8186-6245-X Semiconductor storage devicesCongressesTestingRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesCongressesTestingRandom access memoryCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitIEEE Computer Society Test Technology Technical CommitteeIEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and TestingPQKBBOOK9910872746003321Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California2506142UNINA