00650nam# 22001811i 450 UON0051279120231205105507.24420230324d1946 |0itac50 baitaIT|||| |||||[1]:descritte e illustrate da Giulio Emanuele RizzoRomaLa libreria dello Stato1946318 p., [9] c. di tav.ill.36 cm001UON005127902001 Monete greche della Siciliadescritte e illustrate da Giulio Emanuele Rizzo210 RomaLa libreria dello Stato1946215 2 v.36 cm ITSOL20240220RICAUON00512791UNIOR01887oam 2200493zu 450 991087274600332120241212214954.0(CKB)111026746738630(SSID)ssj0000396431(PQKBManifestationID)12138768(PQKBTitleCode)TC0000396431(PQKBWorkID)10465039(PQKB)11504310(EXLCZ)9911102674673863020160829d1994 uy engtxtccrRecords of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California[Place of publication not identified]IEEE Computer Society Press1994Bibliographic Level Mode of Issuance: Monograph9780818662454 081866245X Semiconductor storage devicesCongressesTestingRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesCongressesTesting.Random access memoryCongresses.Electrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitIEEE Computer Society Test Technology Technical CommitteeIEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and TestingPQKBBOOK9910872746003321Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California2506142UNINA