02175oam 2200505zu 450 991087273520332120241212215058.0(CKB)111055184227404(SSID)ssj0000395944(PQKBManifestationID)12171348(PQKBTitleCode)TC0000395944(PQKBWorkID)10456888(PQKB)11155067(EXLCZ)9911105518422740420160829d2002 uy engtxtccrInternational Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings[Place of publication not identified]IEEE Computer Society2002Bibliographic Level Mode of Issuance: Monograph9780769515618 0769515614 Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsDesign and constructionVery large scale integrationCongressesIntegrated circuitsVery large scale integrationComputer-aided designCongressesIntegrated circuitsVery large scale integrationQuality controlTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsDesign and constructionVery large scale integrationIntegrated circuitsVery large scale integrationComputer-aided designIntegrated circuitsVery large scale integrationQuality controlTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5IEEE Computer Society Technical Committee on VLSI,PQKBPROCEEDING9910872735203321International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings2359231UNINA