01926oam 2200505zu 450 991087273300332120241212215007.0(CKB)111026746740838(SSID)ssj0000442249(PQKBManifestationID)12154657(PQKBTitleCode)TC0000442249(PQKBWorkID)10462639(PQKB)11198942(EXLCZ)9911102674674083820160829d1995 uy engtxtccrRecords of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California[Place of publication not identified]IEEE Computer Society Press1995Bibliographic Level Mode of Issuance: Monograph9780818671029 0818671025 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingCongresses.Random access memoryCongresses.Electrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitRajkanan KIEEE Computer Society Test Technology Technical CommitteeIEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and TestingPQKBBOOK9910872733003321Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California2424485UNINA