01845oam 2200481zu 450 991087270800332120241212214824.0(CKB)111026746705932(SSID)ssj0000450946(PQKBManifestationID)12173472(PQKBTitleCode)TC0000450946(PQKBWorkID)10444463(PQKB)11022057(EXLCZ)9911102674670593220160829d1992 uy engtxtccrDiscover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA[Place of publication not identified]The Conference1992Bibliographic Level Mode of Issuance: Monograph9780780307605 0780307607 Integrated circuitsTestingCongressesAutomatic test equipmentCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingAutomatic test equipmentElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/028/7IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBBOOK9910872708003321Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA2526020UNINA