02004oam 2200529zu 450 991087270230332120241212215048.0(CKB)111055184228438(SSID)ssj0000395443(PQKBManifestationID)12084995(PQKBTitleCode)TC0000395443(PQKBWorkID)10450598(PQKB)10557469(EXLCZ)9911105518422843820160829d2002 uy engtxtccrProceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France[Place of publication not identified]IEEE Computer Society2002Bibliographic Level Mode of Issuance: Monograph9780769516172 0769516173 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Wik TCourtois BZorian YervantIEEE Computer SocietyIEEE Computer Society Technical Council on Test Technology.IEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and Testing.PQKBPROCEEDING9910872702303321Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France2372861UNINA