01982oam 2200505zu 450 991087268170332120241212214921.0(CKB)111026746731806(SSID)ssj0000443595(PQKBManifestationID)12111932(PQKBTitleCode)TC0000443595(PQKBWorkID)10455267(PQKB)11376325(EXLCZ)9911102674673180620160829d1988 uy engtxtccrNew frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC[Place of publication not identified]Computer Society Press of the IEEE1988Bibliographic Level Mode of Issuance: Monograph9780818608704 0818608706 Integrated circuitsTestingCongressesElectronic digital computersTestingCircuitsCongressesAutomatic test equipmentCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingElectronic digital computersTestingCircuitsAutomatic test equipmentElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.395IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBBOOK9910872681703321New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC2527689UNINA