01281oam 2200397zu 450 991087267550332120241212214848.0(CKB)111026746716012(SSID)ssj0000454970(PQKBManifestationID)12175360(PQKBTitleCode)TC0000454970(PQKBWorkID)10399399(PQKB)10059593(NjHacI)99111026746716012(EXLCZ)9911102674671601220160829d1997 uy engur|||||||||||txtccr1997 IEEE International Conference on Microelectronic Test Structures Proceedings[Place of publication not identified]IEEE19971 online resource (200 pages)Bibliographic Level Mode of Issuance: Monograph9780780332430 0780332431 Integrated circuitsTestingIntegrated circuitsTesting.621.3815IEEE, Institute of Electrical and Electronics Engineers, Inc. StaffPQKBBOOK99108726755033211997 IEEE International Conference on Microelectronic Test Structures Proceedings2525485UNINA