02204oam 2200565zu 450 991087267330332120241212214858.0(CKB)111026746722772(SSID)ssj0000395085(PQKBManifestationID)12154915(PQKBTitleCode)TC0000395085(PQKBWorkID)10449853(PQKB)10646649(EXLCZ)9911102674672277220160829d1998 uy engtxtccr1998 Fourth International High Temperature Electronics Conference : HITEC, Albuquerque, New Mexico, USA, June 14-18, 1998[Place of publication not identified]The Institute of Electrical and Electronics Engineers Inc1998Bibliographic Level Mode of Issuance: Monograph9780780345409 0780345401 ElectronicsMaterialsCongressesHeat resistant materialsCongressesSilicon-on-insulator technologyCongressesField-effect transistorsCongressesGallium arsenideCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCElectronicsMaterialsCongresses.Heat resistant materialsSilicon-on-insulator technologyField-effect transistorsCongresses.Gallium arsenideCongresses.Electrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.381/04Air Force Research Laboratory (Wright-Patterson Air Force Base, Ohio),IEEE Electron Devices Society,Components, Packaging & Manufacturing Technology Society,International High Temperature Electronics Conference.PQKBPROCEEDING99108726733033211998 Fourth International High Temperature Electronics Conference : HITEC, Albuquerque, New Mexico, USA, June 14-18, 19982507918UNINA