02492oam 2200409zu 450 991087266120332120210807003239.0(CKB)111026746701384(SSID)ssj0000558978(PQKBManifestationID)12225406(PQKBTitleCode)TC0000558978(PQKBWorkID)10566088(PQKB)11131249(NjHacI)99111026746701384(EXLCZ)9911102674670138420160829d2000 uy engur|||||||||||txtccrVLSI Test Symposium (VTS 2000): 18th IEEE[Place of publication not identified]IEEE Computer Society Press20001 online resource (478 pages) illustrationsBibliographic Level Mode of Issuance: Monograph0-7695-0613-5 Includes bibliographical references and index.Foreword -- Organizing Committee -- Steering Committe -- Program Committee -- Reviewers -- VTS '99 Best Paper Award -- VTS '99 Best Panel Award -- Test Technology Technical Council -- Test Technology Education Program: Overview Tutorials -- Plenary Session -- Welcome Message -- Adit Singh -- Keynote Address: "Optical Internet: Industry Challenge" -- Brian McFadden -- Program Introduction -- Joan Figueras -- Invited Presentation: "Wall Street Perspective on System-on-Chip and Test Technology" -- Erach D. Desai.Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.Integrated circuitsVery large scale integrationTestingIntegrated circuitsVery large scale integrationTesting.621.3950287PQKBPROCEEDING9910872661203321VLSI Test Symposium (VTS 2000): 18th IEEE2355417UNINA