01860oam 2200397zu 450 991087265970332120241212214805.0(CKB)111026746700294(SSID)ssj0000558311(PQKBManifestationID)12197969(PQKBTitleCode)TC0000558311(PQKBWorkID)10558269(PQKB)11266474(NjHacI)99111026746700294(EXLCZ)9911102674670029420160829d1999 uy engur|||||||||||txtccrVIUF Fall Workshop: Proceedings Workshop, Orlando, Florida, 1999[Place of publication not identified]IEEE Computer Society Press19991 online resource (200 pages)Bibliographic Level Mode of Issuance: Monograph9780769504650 0769504655 Contains 14 papers presented at the October 1999 conference, along with abstracts of the five workshops held. The papers discuss design reuse, test and functional verification, and business issues. Among the topics are reusable test environments for digital designs, OBDD extraction from VHDL gate level descriptions at design elaboration, hardware/software co-design for IP objects based on CORBA, strategic management issues for starting an IP company, and VHDL modeling of an adaptive architecture for real-time image enhancement. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.Electronic circuit designData processingCongressesElectronic circuit designData processing621.38150285PQKBPROCEEDING9910872659703321VIUF Fall Workshop: Proceedings Workshop, Orlando, Florida, 19992419495UNINA