01769oam 2200505zu 450 991087264930332120241212214928.0(CKB)111026746730730(SSID)ssj0000394952(PQKBManifestationID)12170524(PQKBTitleCode)TC0000394952(PQKBWorkID)10426419(PQKB)11676062(EXLCZ)9911102674673073020160829d2000 uy engtxtccr2000 GaAs Reliability Workshop : proceedings : November 5, 2000, Seattle, Washington[Place of publication not identified]IEEE2000Bibliographic Level Mode of Issuance: Monograph9780790801025 0790801027 Gallium arsenide semiconductorsReliabilityCongressesSemiconductorsMaterialsCongressesSemiconductorsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCGallium arsenide semiconductorsReliabilitySemiconductorsMaterialsSemiconductorsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/2JEDEC JC-14.7 Committee on GaAs Reliability and Quality StandardsIEEE Electron Devices SocietyGaAs Reliability WorkshopPQKBPROCEEDING99108726493033212000 GaAs Reliability Workshop : proceedings : November 5, 2000, Seattle, Washington2523808UNINA