01705oam 2200445zu 450 991087264750332120241212214908.010.1109/RELPHY.1998(CKB)111026746721686(SSID)ssj0000455045(PQKBManifestationID)12147510(PQKBTitleCode)TC0000455045(PQKBWorkID)10399403(PQKB)11672022(NjHacI)99111026746721686(EXLCZ)9911102674672168620160829d1998 uy engur|||||||||||txtccr1998 IEEE International Reliability Physics Symposium[Place of publication not identified]IEEE19981 online resource (400 pages)Bibliographic Level Mode of Issuance: Monograph9780780344006 0780344006 The IRPS deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics derived in the user's environment. This conference covers the identification of new microelectronic failure or degradation mechanisms.Electronic apparatus and appliancesReliabilityCongressesIntegrated circuitsReliabilityCongressesElectronic apparatus and appliancesReliabilityIntegrated circuitsReliability621.381IEEE, Institute of Electrical and Electronics Engineers, Inc. StaffPQKBPROCEEDING99108726475033211998 IEEE International Reliability Physics Symposium2508687UNINA