00863nac# 22002171i 450 UON0027228920231205103759.9600291-492120060123f |0itac50 baFR|||| |||||b||||||||||Architectures traditionnelles. Série thématiquedirigée par Christian Seignobos001UON002702332001 ˆLa ‰case obushistoire et reconstitutionChristian Seignobos, Fabien Jamin210 MarseilleParenthèsesPatrimoine sans Frontièresc2003215 210 p.ill.22 cmFRMarseilleUONL001032SEIGNOBOSChristianUONV011491Editions ParenthèsesUONV268012650ITSOL20240220RICAUON00272289Architectures traditionnelles. Série thématique1845655UNIOR02047oam 2200529zu 450 991087263800332120241212215035.0(CKB)111026746748708(SSID)ssj0000443316(PQKBManifestationID)12191128(PQKBTitleCode)TC0000443316(PQKBWorkID)10455911(PQKB)11301841(EXLCZ)9911102674674870820160829d1990 uy engtxtccrThe changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC[Place of publication not identified]IEEE Computer Society Press1990Bibliographic Level Mode of Issuance: Monograph9780818690648 081869064X Integrated circuitsTestingCongressesElectronic digital computersTestingCircuitsCongressesAutomatic test equipmentTestingCongressesSemiconductorsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingElectronic digital computersTestingCircuitsAutomatic test equipmentTestingSemiconductorsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.381/5IEEE Computer Society Philadelphia Chapter.IEEE Computer Society Test Technology Technical CommitteeInternational Test ConferencePQKBBOOK9910872638003321The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC2546571UNINA