01669oam 2200457zu 450 991087262600332120210807003344.0(CKB)111026746745384(SSID)ssj0000450941(PQKBManifestationID)12149624(PQKBTitleCode)TC0000450941(PQKBWorkID)10463855(PQKB)10216469(EXLCZ)9911102674674538420160829d1997 uy engtxtccrIEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C[Place of publication not identified]IEEE Computer Society Press1997Bibliographic Level Mode of Issuance: Monograph0-8186-8123-3 Iddq testingCongressesMetal oxide semiconductors, ComplementaryTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIddq testingCongressesMetal oxide semiconductors, ComplementaryTestingCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5/0287Jayasumana Anura PIEEE Computer Society Technical Test Technology Committee.PQKBBOOK9910872626003321IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C2390261UNINA