01973oam 2200481zu 450 991087255810332120241212215244.0(CKB)1000000000021737(SSID)ssj0000393962(PQKBManifestationID)12108585(PQKBTitleCode)TC0000393962(PQKBWorkID)10386407(PQKB)10832955(EXLCZ)99100000000002173720160829d2003 uy engtxtccr18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts[Place of publication not identified]IEEE Computer Society Press2003Bibliographic Level Mode of Issuance: Monograph9780769520421 0769520421 Integrated circuitsDesign and constructionVery large scale integrationCongressesFault-tolerant computingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionVery large scale integrationFault-tolerant computingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesBolchini CristianaIEEE Computer Society Fault-Tolerant Computing Technical Committee.IEEE Computer Society Test Technology Technical CommitteeIEEE International Symposium on Defect and Fault Tolerance in VLSI SystemsPQKBPROCEEDING991087255810332118th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts2378645UNINA