00986nam0 2200301 450000002863220120612132802.0978-88-386-6652-020120206d2010----km-y0itay50------baitaITy-------001yy<<Il >>bilancioanalisi economiche per le decisioni e la comunicazione della performanceRobert N. Anthony ... [et al.]12 ed.MilanoMacGraw-Hill2010XVI, 231 p.26 cmIn cop.: web site.001000005655001000018411Accounting : text and cases<in italiano>58027BilancioAnalisi658.151221Controllo finanziario. Uso dei rendicontiAnthony,Robert N.ITUNIPARTHENOPE20120206RICAUNIMARC000028632P1 658 B/1443570PIST2012Accounting : text and cases58027UNIPARTHENOPE02179nam 2200493z- 450 991055772700332120231214132942.0(CKB)5400000000046054(oapen)https://directory.doabooks.org/handle/20.500.12854/74332(EXLCZ)99540000000004605420202111d2020 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierEvolution and Functional Mechanisms of Plant Disease ResistanceFrontiers Media SA20201 electronic resource (197 p.)2-88966-199-7 This eBook is a collection of articles from a Frontiers Research Topic. Frontiers Research Topics are very popular trademarks of the Frontiers Journals Series: they are collections of at least ten articles, all centered on a particular subject. With their unique mix of varied contributions from Original Research to Review Articles, Frontiers Research Topics unify the most influential researchers, the latest key findings and historical advances in a hot research area! Find out more on how to host your own Frontiers Research Topic or contribute to one as an author by contacting the Frontiers Editorial Office: frontiersin.org/about/contactScience: general issuesbicsscMedical geneticsbicsscplant disease resistanceevolutionmolecular mechanismregulation mechanismdiversificationScience: general issuesMedical geneticsXue Jia-Yuedt1331597Takken Frank L.WedtNepal Madhav PedtMaekawa TakakiedtShao Zhu-QingedtXue Jia-YuothTakken Frank L.WothNepal Madhav PothMaekawa TakakiothShao Zhu-QingothBOOK9910557727003321Evolution and Functional Mechanisms of Plant Disease Resistance3040477UNINA01973oam 2200481zu 450 991087255810332120241212215244.0(CKB)1000000000021737(SSID)ssj0000393962(PQKBManifestationID)12108585(PQKBTitleCode)TC0000393962(PQKBWorkID)10386407(PQKB)10832955(EXLCZ)99100000000002173720160829d2003 uy engtxtccr18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts[Place of publication not identified]IEEE Computer Society Press2003Bibliographic Level Mode of Issuance: Monograph9780769520421 0769520421 Integrated circuitsDesign and constructionVery large scale integrationCongressesFault-tolerant computingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionVery large scale integrationFault-tolerant computingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesBolchini CristianaIEEE Computer Society Fault-Tolerant Computing Technical Committee.IEEE Computer Society Test Technology Technical CommitteeIEEE International Symposium on Defect and Fault Tolerance in VLSI SystemsPQKBPROCEEDING991087255810332118th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts2378645UNINA