01661oam 2200469zu 450 991087255130332120210806235849.0(CKB)1000000000036024(SSID)ssj0000396259(PQKBManifestationID)12123964(PQKBTitleCode)TC0000396259(PQKBWorkID)10460597(PQKB)11332350(EXLCZ)99100000000003602420160829d2005 uy engtxtccr2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California[Place of publication not identified]JEDEC2005Bibliographic Level Mode of Issuance: Monograph0-7908-0106-X Gallium arsenide semiconductorsReliabilityCongressesSemiconductorsMaterialsCongressesSemiconductorsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCGallium arsenide semiconductorsReliabilitySemiconductorsMaterialsSemiconductorsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringIEEE Electron Devices SocietyJEDEC JC-14.7 Committee on GaAs Reliability and Quality StandardsPQKBPROCEEDING99108725513033212005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California2534678UNINA