01870oam 2200481zu 450 991087254810332120241212215205.0(CKB)1000000000021674(SSID)ssj0000395822(PQKBManifestationID)12145836(PQKBTitleCode)TC0000395822(PQKBWorkID)10460257(PQKB)10485621(EXLCZ)99100000000002167420160829d2003 uy engtxtccrProceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece[Place of publication not identified]IEEE Computer Society2003Bibliographic Level Mode of Issuance: Monograph9780769519685 0769519687 Electronic circuitsTestingData processingCongressesError-correcting codes (Information theory)CongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCElectronic circuitsTestingData processingError-correcting codes (Information theory)Electrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48Metra CIEEE Computer Society Technical Council on Test Technology.IEEE International On-Line Testing SymposiumPQKBPROCEEDING9910872548103321Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece2389413UNINA