01910oam 2200505zu 450 991087252700332120241212215309.0(CKB)1000000000022552(SSID)ssj0000394124(PQKBManifestationID)12120541(PQKBTitleCode)TC0000394124(PQKBWorkID)10378757(PQKB)10695507(EXLCZ)99100000000002255220160829d2004 uy engtxtccrDBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA[Place of publication not identified]IEEE2004Bibliographic Level Mode of Issuance: Monograph9780780389502 0780389506 Metal oxide semiconductors, ComplementaryDefectsCongressesIntegrated circuitsCongressesIddq testingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCMetal oxide semiconductors, ComplementaryDefectsIntegrated circuitsIddq testingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.39/732Menon Sankaran MIEEE Computer Society Test Technology Technical CommitteeIEEE International Workshop on Defect Based TestingPQKBPROCEEDING9910872527003321DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA2324854UNINA