01964oam 2200517zu 450 991087251610332120210807000234.0(CKB)1000000000021866(SSID)ssj0000395445(PQKBManifestationID)12122315(PQKBTitleCode)TC0000395445(PQKBWorkID)10454913(PQKB)11044342(EXLCZ)99100000000002186620160829d2004 uy engurmnu---|||||txtccrMTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA[Place of publication not identified]IEEE Computer Society2004Bibliographic Level Mode of Issuance: Monograph0-7695-2193-2 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitWik TIEEE Computer SocietyIEEE Computer Society Technical Council on Test Technology.IEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design and TestingPQKBPROCEEDING9910872516103321MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA2408685UNINA