02024oam 2200517zu 450 991087250930332120210806235726.0(CKB)1000000000021966(SSID)ssj0000394745(PQKBManifestationID)12171889(PQKBTitleCode)TC0000394745(PQKBWorkID)10388755(PQKB)11789495(EXLCZ)99100000000002196620160829d2005 uy engtxtccr5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004[Place of publication not identified]IEEE Computer Society2005Bibliographic Level Mode of Issuance: Monograph0-7695-2320-X MicroprocessorsTestingCongressesIntegrated circuitsTestingCongressesIntegrated circuitsVerificationCongressesSystems on a chipTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCMicroprocessorsTestingIntegrated circuitsTestingIntegrated circuitsVerificationSystems on a chipTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences004.16IEEE Xplore (Online service)IEEE Computer Society Technical Council on Test Technology.International Workshop on Microprocessor Test and VerificationPQKBPROCEEDING99108725093033215th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 20042350004UNINA