01735oam 2200505zu 450 991087250860332120241212214925.0(CKB)111026746727330(SSID)ssj0000454734(PQKBManifestationID)12150189(PQKBTitleCode)TC0000454734(PQKBWorkID)10397860(PQKB)11704822(EXLCZ)9911102674672733020160829d1999 uy engtxtccrProceedings, International Test Conference 1999[Place of publication not identified]International Test Conference1999Bibliographic Level Mode of Issuance: Monograph9780780357532 0780357531 Integrated circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesEmbedded computer systemsTestingCongressesMicroprocessorsTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingElectronic digital computersCircuitsTestingEmbedded computer systemsTestingMicroprocessorsTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815/48IEEE Computer SocietyPQKBPROCEEDING9910872508603321Proceedings, International Test Conference 19992380645UNINA