01432oam 2200433zu 450 991087250690332120241212214927.010.1109/IWSTM.2000(CKB)111026746728422(SSID)ssj0000454694(PQKBManifestationID)12160803(PQKBTitleCode)TC0000454694(PQKBWorkID)10398467(PQKB)11516397(NjHacI)99111026746728422(EXLCZ)9911102674672842220160829d2000 uy engur|||||||||||txtccr2000 5th International Workshop on Statistical Metrology[Place of publication not identified]I E E E20001 online resource (90 pages) illustrationsBibliographic Level Mode of Issuance: Monograph9780780358966 0780358961 SemiconductorsCharacterizationStatistical methodsCongressesSemiconductorsCongressesSemiconductorsCharacterizationStatistical methodsSemiconductors621.3815/2/0287IEEE, Institute of Electrical and Electronics Engineers, Inc. StaffPQKBPROCEEDING99108725069033212000 5th International Workshop on Statistical Metrology2530469UNINA