01826oam 2200481zu 450 991087246630332120241212215311.0(CKB)1000000000022186(SSID)ssj0000395391(PQKBManifestationID)12119854(PQKBTitleCode)TC0000395391(PQKBWorkID)10450482(PQKB)10209266(EXLCZ)99100000000002218620160829d2003 uy engtxtccr2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003[Place of publication not identified]IEEE Society2003Bibliographic Level Mode of Issuance: Monograph9780780381575 0780381572 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING99108724663033212003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 20032537841UNINA