01830oam 2200481zu 450 991087244040332120241212215301.0(CKB)1000000000022026(SSID)ssj0000395390(PQKBManifestationID)12081924(PQKBTitleCode)TC0000395390(PQKBWorkID)10450871(PQKB)10313306(EXLCZ)99100000000002202620160829d2002 uy engtxtccr2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002[Place of publication not identified]IEEE Society2002Bibliographic Level Mode of Issuance: Monograph9780780375581 0780375580 Integrated circuitsReliabilityCongressesIntegrated circuitsWafer-scale integrationReliabilityCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsWafer-scale integrationReliabilityElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING99108724404033212002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 20022513244UNINA