01439oam 2200433zu 450 991087243520332120210807003227.0(CKB)111026746701440(SSID)ssj0000558309(PQKBManifestationID)12157900(PQKBTitleCode)TC0000558309(PQKBWorkID)10557916(PQKB)11675580(EXLCZ)9911102674670144020160829d2000 uy engtxtccrEuropean Test Workshop 2000, IEEE, Postproceedings[Place of publication not identified]IEEE Computer Society Press2000Bibliographic Level Mode of Issuance: Monograph0-7695-0701-8 Integrated circuitsTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48IEEE Computer Society Technical Council on Test Technology.IEEE Computer SocietyPQKBPROCEEDING9910872435203321European Test Workshop 2000, IEEE, Postproceedings2373269UNINA