00660nam0-22002411i-450-990001242520403321000124252FED01000124252(Aleph)000124252FED0100012425220000920d1984----km-y0itay50------baengOrdersDescription and rolesby POUZET M . DENIS Richard.Amsterdam [etc.]North-Holland1984.North-Holland mathematics studies99ITUNINARICAUNIMARCBK990001242520403321C-21-(99974MA1MA1Orders82967UNINAING0102366oam 2200433zu 450 991087243450332120241212215018.0(CKB)111026746743032(SSID)ssj0000558513(PQKBManifestationID)12289820(PQKBTitleCode)TC0000558513(PQKBWorkID)10565396(PQKB)11243625(NjHacI)99111026746743032(EXLCZ)9911102674674303220160829d1996 uy engur|||||||||||txtccrMemory Technology, Design and Testing, 1996: IEEE International Workshop On[Place of publication not identified]IEEE Computer Society Press19961 online resourceBibliographic Level Mode of Issuance: Monograph9780818674662 0818674660 Memory Technology, Design and Testing -- Future trends in flash memories -- Recent developments in dram testing -- Built in self testing for detection of coupling faults in semiconductor memories -- A built in self test scheme for 256Meg sdram -- Proposed on-chip test structure to quantify trap densities within flash meories -- A concurrent placement and routing strategy for improving the quality of application specific memory designs -- Flash memory quality and reliability issues -- A low power current sensing scheme for cmos sram.The keynote speech on future trends in flash memories is followed by 16 additional review and research papers. Among the topics are built-in self-testing for detecting of coupling faults in semiconductor memories, a low-power current sensing scheme for CMOS SRAM, scanning capacitance microscopy analysis of DRAM trench capacitors, the thermal monitoring of memories, and a true testprocessor-per-pin algorithmic pattern generator. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.Random access memorySemiconductor storage devicesTestingRandom access memory.Semiconductor storage devicesTesting.004.5PQKBBOOK9910872434503321Memory Technology, Design and Testing, 1996: IEEE International Workshop On2338176UNINA