02030oam 2200505zu 450 991084051150332120210807004009.01-4443-0548-41-4443-0561-1(CKB)2500000000001677(SSID)ssj0000354667(PQKBManifestationID)11925307(PQKBTitleCode)TC0000354667(PQKBWorkID)10322584(PQKB)10480396(EXLCZ)99250000000000167720160829d2008 uy engtxtccrPrinciples and applications of powder diffraction[Place of publication not identified]John Wiley and Sons Ltd2008Bibliographic Level Mode of Issuance: Monograph1-4051-6222-8 An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant.X-raysMeasurementDiffractionPowdersOptical propertiesLight & OpticsHILCCPhysicsHILCCPhysical Sciences & MathematicsHILCCX-raysMeasurementDiffractionPowdersOptical propertiesLight & OpticsPhysicsPhysical Sciences & Mathematics548/.83Clearfield AbrahamReibenspies Joseph HenryBhuvanesh NattamaiPQKBBOOK9910840511503321Principles and applications of powder diffraction4136874UNINA