02664nam 2200565Ia 450 991083116200332120230725020956.03-527-63387-11-283-14068-397866131406853-527-63385-53-527-63386-3(CKB)2560000000060948(EBL)661855(OCoLC)707067696(SSID)ssj0000466726(PQKBManifestationID)12165192(PQKBTitleCode)TC0000466726(PQKBWorkID)10466567(PQKB)10574066(MiAaPQ)EBC661855(EXLCZ)99256000000006094820780516d2011 uy 0engur|n|---|||||txtccrAdvances in speckle metrology and related techniques[electronic resource] /edited by Guillermo H. Kaufmann4th ed.Weinheim Wiley-VCH Verlagc20111 online resource (329 p.)Description based upon print version of record.3-527-40957-2 Includes bibliographical references and index.Advances in Speckle Metrology and Related Techniques; Contents; Preface; List of Contributors; 1 Radial Speckle Interferometry and Applications; 2 Depth-Resolved Displacement Field Measurement; 3 Single-Image Interferogram Demodulation; 4 Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods; 5 Optical Vortex Metrology; 6 Speckle Coding for Optical and Digital Data Security Applications; IndexSpeckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over tSpeckle metrologyOptical measurementsSpeckle metrology.Optical measurements.621.36Kaufmann Guillermo H1638991MiAaPQMiAaPQMiAaPQBOOK9910831162003321Advances in speckle metrology and related techniques3981708UNINA