01047nam a2200253 i 4500991000751509707536050117s2001 maua b 001 0 eng 0201719762b13267462-39ule_instDip.to Ingegneria dell'Innovazioneita 005.15Tannenbaum, Adrienne,1955-621691Metadata solutions :using metamodels, repositories, XML, and enterprise portals to generate information on demand /Adrienne TannenbaumBoston :Addison-Wesley,c2001xxv, 490 p. :ill. ;24 cmInclude riferimenti bibliografici e indiceInformation technologyMetadata.b1326746221-09-0617-01-05991000751509707536LE026 005.15 TAN 01.01 200212026000022260le026Prof. Romano / BibliotecapE50.13-l- 40000.i1398526717-01-05Metadata solutions1106492UNISALENTOle02617-01-05ma -engmau0002127nam 2200577 450 991083068770332120230810001117.01-118-70715-X1-118-70712-51-118-70714-1(CKB)3710000000894718(PQKBManifestationID)16521834(PQKBWorkID)15049317(PQKB)23995154(MiAaPQ)EBC4714697(DLC) 2016033086(EXLCZ)99371000000089471820170104h20172017 uy 0engurcnu||||||||txtccrESD testing from components to systems /Steven H. VoldmanChichester, West Sussex, England :Wiley,2017.©20171 online resource (324 pages) illustrationsESD seriesBibliographic Level Mode of Issuance: Monograph0-470-51191-5 Includes bibliographical references at the end of each chapters and index.Human body model -- Machine model -- Charged device model -- Transmission line pulse (TLP) -- Very fast transmission line pulse (VF-TLP) -- IEC 61000-4-2 -- Human metal model (HMM) -- IEC 61000-4-5 -- Cable discharge event (CDE) -- Latchup -- Electrical overstress (EOS) -- Electromagnetic compatibility (EMC) testing.Electronic circuitsEffect of radiation onElectronic apparatus and appliancesTestingElectric dischargesDetectionElectric dischargesMeasurementElectrostaticsElectronic circuitsEffect of radiation on.Electronic apparatus and appliancesTesting.Electric dischargesDetection.Electric dischargesMeasurement.Electrostatics.621.3815/4Voldman Steven H.872423MiAaPQMiAaPQMiAaPQBOOK9910830687703321ESD testing3929182UNINA