01493nam 2200469 450 991083041760332120161213103920.01-118-71797-X(CKB)4330000000006896(MiAaPQ)EBC4721144(DLC) 2015032319(EXLCZ)99433000000000689620161104h20172017 uy 0engurcnu||||||||rdacontentrdamediardacarrierMeasurement technology for micro-nanometer devices /Wendong Zhang [and eight others]Singapore :Wiley :National Defense Industry Press,2017.©20171 online resource (344 pages)1-118-71798-8 1-118-71796-1 Includes bibliographical references at the end of each chapters and index.MicrotechnologyMeasurementNanotechnologyMeasurementMicroelectromechanical systemsTestingPhysical measurementsMicrotechnologyMeasurement.NanotechnologyMeasurement.Microelectromechanical systemsTesting.Physical measurements.681/.2Zhang WendongMiAaPQMiAaPQMiAaPQBOOK9910830417603321Measurement technology for micro-nanometer devices3916370UNINA00981cam2 22002653 450 SOBE0008188620250121113523.088-14-08613-320250121d2000 |||||ita|0103 baitaIT<<2: >>Ordinamento finanziario e contabilecommento agli articoli 149-275 del D. lgs. 18 agosto 2000, n. 267Bisso ... et al.MilanoGiuffrè2000XXX, 663 p.24 cm001SON00030732001 Testo Unico degli Enti locali / coordinato da Vittorio ItaliaBisso, GianlucaSOBA00032340070ITUNISOB20250121RICAUNISOBUNISOB340|Coll|12|A103958SOBE00081886M 102 Monografia moderna SBNM340|Coll|12|A000016-3SI103958rovitoUNISOBUNISOB20250121113251.020250121113317.0rovitoOrdinamento finanziario e contabile1407634UNISOB