05253nam 22006735 450 99646547760331620230406032413.03-540-78800-X10.1007/978-3-540-78800-3(CKB)1000000000491038(SSID)ssj0000320413(PQKBManifestationID)11263733(PQKBTitleCode)TC0000320413(PQKBWorkID)10249393(PQKB)11308605(DE-He213)978-3-540-78800-3(MiAaPQ)EBC3068717(PPN)125218648(EXLCZ)99100000000049103820100301d2008 u| 0engurnn|008mamaatxtccrTools and Algorithms for the Construction and Analysis of Systems[electronic resource] 14th International Conference, TACAS 2008, Held as Part of the Joint European Conferences on Theory and Practice of Software, ETAPS 2008, Budapest, Hungary, March 29-April 6, 2008, Proceedings /edited by C.R. Ramakrishnan, Jakob Rehof1st ed. 2008.Berlin, Heidelberg :Springer Berlin Heidelberg :Imprint: Springer,2008.1 online resource (XVI, 520 p.) Theoretical Computer Science and General Issues,2512-2029 ;4963Bibliographic Level Mode of Issuance: Monograph3-540-78799-2 Includes bibliographical references and index.Invited Talk -- Hardware Verification: Techniques, Methodology and Solutions -- Parameterized Systems -- Extending Automated Compositional Verification to the Full Class of Omega-Regular Languages -- Graph Grammar Modeling and Verification of Ad Hoc Routing Protocols -- Proving Ptolemy Right: The Environment Abstraction Framework for Model Checking Concurrent Systems -- Model Checking – I -- Revisiting Resistance Speeds Up I/O-Efficient LTL Model Checking -- Antichains: Alternative Algorithms for LTL Satisfiability and Model-Checking -- On-the-Fly Techniques for Game-Based Software Model Checking -- Computing Simulations over Tree Automata -- Applications -- Formal Pervasive Verification of a Paging Mechanism -- Analyzing Stripped Device-Driver Executables -- Model Checking-Based Genetic Programming with an Application to Mutual Exclusion -- Model Checking – II -- Conditional Probabilities over Probabilistic and Nondeterministic Systems -- On Automated Verification of Probabilistic Programs -- Symbolic Model Checking of Hybrid Systems Using Template Polyhedra -- Fast Directed Model Checking Via Russian Doll Abstraction -- Static Analysis -- A SAT-Based Approach to Size Change Termination with Global Ranking Functions -- Efficient Automatic STE Refinement Using Responsibility -- Reasoning Algebraically About P-Solvable Loops -- On Local Reasoning in Verification -- Concurrent/Distributed Systems -- Interprocedural Analysis of Concurrent Programs Under a Context Bound -- Context-Bounded Analysis of Concurrent Queue Systems -- On Verifying Fault Tolerance of Distributed Protocols -- Tools – I -- The Real-Time Maude Tool -- Z3: An Efficient SMT Solver -- Computation and Visualisation of Phase Portraits for Model Checking SPDIs -- GOAL Extended: Towards a Research Tool for Omega Automata and Temporal Logic -- Symbolic Execution -- RWset: Attacking Path Explosion in Constraint-Based Test Generation -- Demand-Driven Compositional Symbolic Execution -- Peephole Partial Order Reduction -- Abstraction, Interpolation -- Efficient Interpolant Generation in Satisfiability Modulo Theories -- Quantified Invariant Generation Using an Interpolating Saturation Prover -- Accelerating Interpolation-Based Model-Checking -- Automatically Refining Abstract Interpretations -- Tools – II -- SVISS: Symbolic Verification of Symmetric Systems -- RESY: Requirement Synthesis for Compositional Model Checking -- Scoot: A Tool for the Analysis of SystemC Models -- Trust, Reputation -- Trusted Source Translation of a Total Function Language -- Rocket-Fast Proof Checking for SMT Solvers -- SDSIrep: A Reputation System Based on SDSI.Theoretical Computer Science and General Issues,2512-2029 ;4963Software engineeringComputer scienceComputer networksAlgorithmsSoftware EngineeringComputer Science Logic and Foundations of ProgrammingComputer Communication NetworksAlgorithmsSoftware engineering.Computer science.Computer networks.Algorithms.Software Engineering.Computer Science Logic and Foundations of Programming.Computer Communication Networks.Algorithms.005.1Ramakrishnan C.Redthttp://id.loc.gov/vocabulary/relators/edtRehof Jakobedthttp://id.loc.gov/vocabulary/relators/edtETAPS 2008(2008 :Budapest, Hungary)BOOK996465477603316Tools and Algorithms for the Construction and Analysis of Systems772021UNISA05677nam 2200697 450 991083041490332120230125182159.01-118-21107-31-282-30641-397866123064190-470-49507-30-470-49506-510.1002/9780470495070(CKB)1000000000807034(EBL)469663(SSID)ssj0000294878(PQKBManifestationID)11214163(PQKBTitleCode)TC0000294878(PQKBWorkID)10313246(PQKB)11208510(MiAaPQ)EBC469663(MiAaPQ)EBC4032890(CaBNVSL)mat05361037(IDAMS)0b00006481178851(IEEE)5361037(OCoLC)463436641(PPN)270674993(EXLCZ)99100000000080703420091105h20152009 uy 0engur|n|---|||||txtccrElectrostatic discharge understand, simulate and fix ESD problems /Michel Mardiguian3rd ed.Piscataway, New Jersey :IEEE Press,2009.[Piscataqay, New Jersey] :IEEE Xplore,[2009]1 online resource (315 p.)Description based upon print version of record.0-470-39704-7 Includes bibliographical references and index.Preface to the First Edition -- Preface to the Third Edition -- Acknowledgements -- 1. The Electrostatic Discharge Phenomenon -- 1.1. Physics Involved -- 1.2. Influencing Parameters -- 1.3. Various Types of Electrostatic Charging with Humans and Objects -- 1.4. Statistics of Voltages and Currents Reached During ESD -- 1.5. Waveforms of Electrostatic Discharges -- References -- 2. Effects of ESD on Electronics -- 2.1. Direct Discharge to an Electronic Component -- 2.2. Direct Discharge to Electronic Equipment Enclosure -- 2.3. Indirect Discharge -- 2.4. Coupling Mechanisms of ESD Pulse into the Victim's Circuitry -- 2.5. Response of Victim Circuits and Type of Errors -- 2.6. Prediction of Actual ESD-Induced Error, Fast Approximation Method -- 2.7. Remarks on the Actual Current Paths and Associated Radiation -- 2.8. Personnel or Furniture ESD: Which One is Worse? -- References -- 3. Principal ESD Specifications -- 3.1. ESD Test Specifications for Device Sensitivity -- 3.2. ESD Specifications for Equipment Immunity -- 3.3. Antistatic Control Procedures -- References. -- 4. ESD Diagnostics and Testing. -- 4.1. ESD Simulators: How They Work -- 4.2. Furniture Versus Personnel ESD Simulation -- 4.3. Other Types of ESD Simulators for Component Testing -- 4.4. ESD Test Setup--Direct and Indirect ESD -- 4.5. ESD Test Routine and Discharge Procedures -- 4.6. No Error/No Damage Concept: The Several Layers of Severity -- 4.7. The Error per Discharge Concept or Multiple-Trials Approach -- 4.8. ESD Test During Design and Development -- 4.9. ESD For Field Diagnostics and Forced Crash Method -- 4.10. Home-Made Investigation Tools and Diagnostic Hints -- References -- 5. Design for ESD Immunity -- 5.1. ESD Protection at Component Level -- 5.2. ESD Protection at the PCB Level (Internal Circuitry) -- 5.3. ESD Protection by Internal Wiring and Mechanical Packaging -- 5.4. ESD Protection by Box Shielding and Envelope Design -- 5.5. ESD Protection of External Cables and I/O Ports -- 5.6. ESD Immunity by Software and Noise Inhibition Techniques.5.7. ESD Immunity with Miniature, Portable Devices -- 5.8. System ESD Immunity -- 5.9. ESD Control at Installation Level -- References -- 6. ESD Cases Studies -- 6.1. Case 1: The Reradiating Ground Strap -- 6.2. Case 2: ESD Hardening of a Printer -- 6.3. Case 3: The Data Terminal with Floating Tray -- 6.4. Case 4: The Safety Wire "Antenná<U+009d> -- 6.5. Case 5: The Touchy Watchdog -- 6.6. Case 6: The Trigger-Happy Air bag Initiator -- 6.7. Conclusion: Troubleshooting Hints -- Appendix A. ESD Protection by Design of Chips and Microcircuits -- Appendix B. Prediction of ESD Damage Level for a Semiconductor Junction -- Appendix C. Spark-Over Voltages -- Appendix D. Fatigue Phenomena During Repeated ESD Testing -- Appendix E. Prediction of ESD-Induced Noise by Fast Frequency- Domain Calculations -- Appendix F. More Experiments on ESD Coupling to Boxes -- Appendix G. Examples of Simple SPICE Modeling of ESD Coupling Effects -- Appendix H. Time-to-Frequency Conversion for a Single Transient -- Index.A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as ""the most thorough and concise treatment of the broad ESD continuum that is available."" Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover: Effects of ESDElectronic apparatus and appliancesProtectionElectric dischargesElectrostaticsElectronic apparatus and appliancesProtection.Electric discharges.Electrostatics.621.317621.3815Mardiguian Michel754717CaBNVSLCaBNVSLCaBNVSLBOOK9910830414903321Electrostatic discharge1888190UNINA