05341nam 2200685 a 450 991083020270332120230801225952.01-118-56288-71-283-94140-61-118-56293-3(CKB)2670000000316641(EBL)1106547(OCoLC)823722212(SSID)ssj0000804267(PQKBManifestationID)11457990(PQKBTitleCode)TC0000804267(PQKBWorkID)10821734(PQKB)10964835(OCoLC)824081599(MiAaPQ)EBC1106547(EXLCZ)99267000000031664120120208d2012 uy 0engur|n|---|||||txtccrX-rays and materials[electronic resource] /edited by Philippe Goudeau, René GuinebretièreHoboken, N.J. ISTE/Wiley20121 online resource (240 p.)ISTEDescription based upon print version of record.1-84821-342-5 Includes bibliographical references and index.Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation3.5.2. Separation of diffraction components in hybrid nanotubesThis book presents reviews of various aspects of radiation/matter interactions, be these instrumental developments, the application of the study of the interaction of X-rays and materials to a particular scientific field, or specific methodological approaches. The overall aim of the book is to provide reference summaries for a range of specific subject areas within a pedagogical framework. Each chapter is written by an author who is well known within their field and who has delivered an invited lecture on their subject area as part of the "RX2009 - X-rays and Materials" colloquiISTEMaterialsAnalysisX-ray microanalysisX-raysDiffractionX-ray spectroscopyMaterialsAnalysis.X-ray microanalysis.X-raysDiffraction.X-ray spectroscopy.620.11272Goudeau Philippe1699930Guinebretière René960291MiAaPQMiAaPQMiAaPQBOOK9910830202703321X-rays and materials4082559UNINA