03109nam 2200805 450 991082781720332120230803200313.01-5231-0054-03-11-038804-910.1515/9783110305012(CKB)3280000000039051(EBL)1663098(SSID)ssj0001442185(PQKBManifestationID)11952104(PQKBTitleCode)TC0001442185(PQKBWorkID)11418807(PQKB)11712715(MiAaPQ)EBC1663098(DE-B1597)206822(OCoLC)1013944366(OCoLC)1037980219(OCoLC)1041991856(OCoLC)1046607630(OCoLC)1047006569(OCoLC)1049632202(OCoLC)1054867552(OCoLC)892709322(DE-B1597)9783110305012(Au-PeEL)EBL1663098(CaPaEBR)ebr11010257(CaONFJC)MIL808032(OCoLC)896786490(EXLCZ)99328000000003905120150212h20142014 uy 0engur|nu---|u||utxtccrStructure analysis of advanced nanomaterials nanoworld by high-resolution electron microscopy /Takeo OkuBerlin, [Germany] ;Boston, [Massachusetts] :De Gruyter,2014.©20141 online resource (180 p.)Description based upon print version of record.3-11-030501-1 3-11-030472-4 Includes bibliographical references at the end of each chapters and index.Front matter --Preface --Contents --1 Introduction --2 Structure and principle of electron microscopes --3 Practice of HREM --4 Characterization by HREM --5 Electron diffraction analysis of nanostructured materials --6 HREM analysis of nanostructured materials --A Appendix --IndexHigh-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.Transmission electron microscopyHigh resolution electron microscopyNanostructured materialsStructural analysis (Engineering)Advanced Nanomaterials.Crystallography.Industrial Application.Materials Science.Transmission electron microscopy.High resolution electron microscopy.Nanostructured materials.Structural analysis (Engineering)502.825Oku Takeo1034899MiAaPQMiAaPQMiAaPQBOOK9910827817203321Structure analysis of advanced nanomaterials3915360UNINA