02439nam 2200637 a 450 991082487410332120240516091620.03-527-63955-11-283-37949-X97866133794983-527-63954-33-527-63956-X(CKB)2670000000133405(EBL)827027(OCoLC)773301844(SSID)ssj0000638427(PQKBManifestationID)11432337(PQKBTitleCode)TC0000638427(PQKBWorkID)10714451(PQKB)10985625(OCoLC)771282798(MiAaPQ)EBC827027(Au-PeEL)EBL827027(CaPaEBR)ebr10521342(CaONFJC)MIL337949(EXLCZ)99267000000013340520120109d2011 uy 0engur|n|---|||||txtccrMechanical stress on the nanoscale simulation, material systems and characterization techniques /edited by Margrit Hanbücken, Pierre Müller, and Ralf B. Wehrspohn1st ed.Weinheim, Germany Wiley-VCH20111 online resource (382 p.)Description based upon print version of record.3-527-41066-X Includes bibliographical references and index.pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.NanoscienceMechanicsNanoscience.Mechanics.620.115Hanbücken Margrit1680313Müller Pierre663455Wehrspohn Ralf B1680314MiAaPQMiAaPQMiAaPQBOOK9910824874103321Mechanical stress on the nanoscale4048973UNINA