02789nam 2200589 450 991082248090332120230331005413.01-280-52324-797866105232450-19-536465-1(CKB)1000000000398571(EBL)271603(OCoLC)466425385(SSID)ssj0000298624(PQKBManifestationID)11214965(PQKBTitleCode)TC0000298624(PQKBWorkID)10361091(PQKB)11702094(MiAaPQ)EBC271603(Au-PeEL)EBL271603(CaPaEBR)ebr11303221(CaONFJC)MIL52324(EXLCZ)99100000000039857120161129h19881988 uy 0engur|n|---|||||txtccrHigh-resolution transmission electron microscopy and associated techniques /editors, Peter R. Buseck, John M. Cowley, Leroy EyringNew York, New York ;Oxford, [England] :Oxford University Press,1988.©19881 online resource (668 p.)Description based upon print version of record.0-19-504275-1 Includes bibliographical references at the end of each chapters and index.CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES14. HIGHLY DISORDERED MATERIALSINDEXProvides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. This book includes discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, and more.Transmission electron microscopyTransmission electron microscopy.502/.8/25Buseck PeterCowley J. M(John Maxwell),1923-Eyring LeRoyMiAaPQMiAaPQMiAaPQBOOK9910822480903321High-resolution transmission electron microscopy and associated techniques4040615UNINA