01975nam 2200517 450 991081880770332120230228172018.01-4704-0017-0(CKB)3360000000464292(EBL)3113524(SSID)ssj0000973880(PQKBManifestationID)11529966(PQKBTitleCode)TC0000973880(PQKBWorkID)10985409(PQKB)10088642(MiAaPQ)EBC3113524(RPAM)0000000639(PPN)19540890X(EXLCZ)99336000000046429220750515d1951 uy 0engur|n|---|||||txtrdacontentcrdamediacrrdacarrierA representation theory for commutative topological algebra /Richard V. KadisonProvidence :American Mathematical Society,1951.1 online resource (43 pages)Memoirs of the American Mathematical Society ;number 7Cover title.0-8218-1207-6 Bibliography: pages 37-39.""1. Introduction""; ""2. The general representation theorem""; ""3. The algebra theorem of Stone""; ""4. The vector lattice theorem""; ""5. The Banach space characterization""; ""6. The Banach algebra representation theorem""; ""7. Polynomial identities on the norm in a Banach algebra""; ""8. Applications to the theory of operator algebras""; ""Bibliography""Memoirs of the American Mathematical Society ;7.Topological algebrasMathematical analysisTopological algebras.Mathematical analysis.Kadison Richard V.1925-52994MiAaPQMiAaPQMiAaPQBOOK9910818807703321A representation theory for commutative topological algebra3941902UNINA05214nam 2200625Ia 450 991100653190332120200520144314.01-281-11198-897866111119840-08-054721-41-60119-270-3(CKB)1000000000281394(EBL)328563(OCoLC)476125950(SSID)ssj0000072217(PQKBManifestationID)11980019(PQKBTitleCode)TC0000072217(PQKBWorkID)10095686(PQKB)11310010(MiAaPQ)EBC328563(EXLCZ)99100000000028139419840802d1985 uy 0engur|n|---|||||txtccrHandbook of optical constants of solids /edited by Edward D. PalikOrlando Academic Press19851 online resource (824 p.)Academic Press handbook seriesDescription based upon print version of record.0-12-544420-6 Includes bibliographies.Front Cover; Handbook of Optical Constants of Solids; Copyright Page; Table of Contents; List of Contributors; Preface; Part I: DETERMINATION OF OPTICAL CONSTANTS; Chapter 1. Introductory Remarks; I. Introduction; II. The Chapters; III. The Critiques; IV. The Tables; V. The Figures of the Tables; VI. General Remarks; References; Chapter 2. Basic Parameters for Measuring Optical Properties; I. Introduction; II. Intrinsic Material Parameters in Terms of Optical Constants; III. Reflectance, Transmittance, and Absorptanceof Layered StructuresIV. The General Lamelliform-Phase Coherency ThroughoutV. The General Lamelliform-Phase Incoherency in Substrate; VI. Summary; Appendix A. Basic Formulas for Fresnel Coefficients; Appendix B. General Formulas for the Case of a Parallel-Sided Slab; Appendix C. Reflectance, Rjk at j-k Interface; Appendix D. Reflectance of Single Layer on Each Side of a Slab and Single Layer on Either Side of a Slab; Appendix E. Critical Angle of Incidence; Definition of Terms; References; Chapter 3. Dispersion Theory, Sum Rules, and Their Application to the Analysis of Optical Data; I. IntroductionII. Optical Sum Rules and Their Physical InterpretationIII. Finite-Energy Sum Rules; IV. Sum Rules for Reflection Spectroscopy; V. Analysis of Optical Data and Sum-Rule Applications; VI. Summary; References; Chapter 4. Measurement of Optical Constants in the Vacuum Ultraviolet Spectral Region; I. Introduction; II. General Discussion of Reflectance Methods; III. Reflectance Method for Two Media; References; Chapter 5. The Accurate Determination of Optical Properties by Ellipsometry; I. Reflection Techniques; Background and Overview; II. Measurement ConfigurationsIII. Accurate Determination of Optical Properties: Overlayer EffectsIV. Living with Overlayers; V. Eliminating Overlayers; VI. Bulk and Thin-Film Effects; Effective-Medium Theory; VII. Conclusion; References; References; Chapter 6. Interferometric Methods for the Determination of Thin-Film Parameters; I. Introduction; II. Basic Principles; III. Nonlaser Interferometers; IV. Kösters-Prism Interferometers; V. A Self-Calibrating Method; VI. Surface Effects; VII. Conclusions; References; Chapter 7. Thin-Film Absorptance Measurements Using Laser Calorimetry; I. IntroductionII. Single-Layer FilmsIII. Wedged-Film Laser Calorimetry; IV. Electric-Field Considerations in Laser Calorimetry; V. Entrance versus Exit Surface Films; VI. Experimental Determination of αf, aaf, and afs; References; Chapter 8. Complex Index of Refraction Measurements at Near-Millimeter Wavelengths; I. Introduction; II. Fourier Transform Spectroscopy; III. Free-Space Resonant Cavity; IV. Mach-Zehnder Interferometer; V. Direct Birefringence Measurement; VI. Overmoded Nonresonant Cavity; VII. Crystal Quartz as Index Reference; VIII. Conclusion; ReferencesChapter 9. The Quantum Extension of the Drude-Zener Theory in Polar SemiconductorsWhile bits and pieces of the index of refraction n and extinction coefficient k for a given material can be found in several handbooks, the Handbook of Optical Constants of Solids gives for the first time a single set of n and k values over the broadest spectral range (ideally from x-ray to mm-wave region). The critiquers have chosen the numbers for you, based on their own broad experience in the study of optical properties. Whether you need one number at one wavelength or many numbers at many wavelengths, what is available in the literature is condensed downAcademic Press handbook series.SolidsOptical propertiesHandbooks, manuals, etcOptical constantsHandbooks, manuals, etcSolidsOptical propertiesOptical constants530.4/1Palik Edward D462273MiAaPQMiAaPQMiAaPQBOOK9911006531903321Handbook of optical constants of solids187350UNINA