01889oem 2200469Ia 450 991069687000332120080723112935.0(CKB)5470000002382180(OCoLC)127128355(EXLCZ)99547000000238218020070515d2007 ca engb|||||||||||||||||||||durcnu--|m||||crdrdacontentcrdamediacrrdacarrierGeologic map of quadrangles 3168 and 3268, Yahya-Wona (703), Wersek (704), Khayr-Kot (521), and Urgon (522) quadrangles, Afghanistan[electronic resource] /compiled by Robert G. Bohannon ; U.S. Department of the Interior, U.S. Geological Survey ; prepared in cooperation with the Afghan Geological Survey ... [and others][Reston, Va.] :U.S. Dept. of the Interior, U.S. Geological Survey,2007.1 electronic map HTML, digital, PDF fileOpen-file report ;2005-1117-AUSGS Afghanistan project product ;no. 020Relief shown by shading.Title from HTML index page (viewed on May 9, 2007)."AGS Open-File Report (703/704/521/522) 2005-1117-A".Includes index map.Geologic map of quadrangles 3168 and 3268, Yahya-Wona GeologyAfghanistanMapsMaps.lcgftGeologyBohannon Robert G1389793Geological Survey (U.S.)Afghanistan.Department of Geological Survey.GISGISGPOBOOK9910696870003321Geologic map of quadrangles 3168 and 3268, Yahya-Wona (703), Wersek (704), Khayr-Kot (521), and Urgon (522) quadrangles, Afghanistan3444303UNINA05618nam 2200709 450 991081836110332120230725050834.01-283-17798-697866131779881-119-97278-71-119-99729-11-119-99730-5(CKB)2550000000041292(EBL)697681(SSID)ssj0000535870(PQKBManifestationID)11373569(PQKBTitleCode)TC0000535870(PQKBWorkID)10546676(PQKB)11581444(MiAaPQ)EBC697681(OCoLC)746324291(EXLCZ)99255000000004129220160401h20112011 uy 0engur|n|---|||||txtccrDigital holography for MEMS and microsystem metrology /edited by Anand AsundiChichester, England :Wiley,2011.©20111 online resource (229 p.)The Wiley microsystem and nanotechnology seriesDescription based upon print version of record.0-470-97869-4 Includes bibliographical references at the end of each chapters and index.Digital Holography for MEMS and Microsystem Metrology; Contents; About the Editor; Contributors; Series Preface; Acknowledgements; Abbreviations; 1 Introduction; 2 Digital Reflection Holography and Applications; 2.1 Introduction to Digital Holography and Methods; 2.1.1 Holography and Digital Holography; 2.1.2 Digital Recording Mechanism; 2.1.3 Numerical Reconstruction Methods; 2.2 Reflection Digital Holographic Microscope (DHM) Systems Development; 2.2.1 Optical Systems and Methodology; 2.3 3D Imaging, Static and Dynamic Measurements; 2.3.1 Numerical Phase and 3D Measurements2.3.2 Digital Holographic Interferometry2.4 MEMS/Microsystems Characterization Applications; 2.4.1 3D Measurements; 2.4.2 Static Measurements and Dynamic Interferometric Measurement; 2.4.3 Vibration Analysis; References; 3 Digital Transmission Holography and Applications; 3.1 Historical Introduction; 3.2 The Foundation of Digital Holography [30]; 3.2.1 Theoretical Analysis of Wavefront Interference; 3.2.2 Digital Hologram Recording and Reconstruction; 3.2.3 Different Numerical Reconstruction Algorithms; 3.3 Digital Holographic Microscopy System3.3.1 Digital Holographic Microscopy with Physical Spherical Phase Compensation3.3.2 Lens-Less Common-Path Digital Holographic Microscope; 3.3.3 Common-Path Digital Holographic Microscope; 3.3.4 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation : Light with Long Coherence Length; 3.3.5 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation : Light with Short Coherence Length; 3.4 Conclusion; References; 4 Digital In-Line Holography and Applications; 4.1 Background; 4.2 Digital In-Line Holography; 4.2.1 Recording and Reconstruction4.3 Methodology for 2D Measurement of Micro-Particles4.3.1 Numerical Reconstruction, Pre-Processing and Background Correction; 4.3.2 Image Segmentation; 4.3.3 Particle Focusing; 4.3.4 Particle Size Measurement; 4.4 Validation and Performance of the 2D Measurement Method; 4.4.1 Verification of the Focusing Algorithm; 4.4.2 Spherical Beads on a Glass Slide; 4.4.3 Microspheres in a Flowing System Normalized Population; 4.4.4 10 μm Microspheres Suspension; 4.4.5 Measurement of Microfibers; 4.5 Methodology for 3D Measurement of Micro-Fibers; 4.5.1 Method 1: The 3D Point Cloud Method4.5.2 Method 2: The Superimposition Method4.6 Validation and Performance of the 3D Measurement Methods; 4.6.1 Experiment with a Single Fiber; 4.6.2 3D Measurements of Micro-Fibers in Suspension; 4.7 Conclusion; References; 5 Other Applications; 5.1 Recording Plane Division Multiplexing (RDM) in Digital Holography for Resolution Enhancement; 5.1.1 Introduction of the Recording Plane Division Multiplexing Technique; 5.1.1.1 The SM Technique; 5.1.1.2 The ADM Technique; 5.1.1.3 The WDM Technique; 5.1.1.4 The PM Technique; 5.1.2 RDM Implemented in Pulsed Digital Holography for Ultra-Fast Recording5.1.2.1 IntroductionApproaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the Wiley microsystem and nanotechnology series.Microelectromechanical systemsMeasurementMicroelectronicsMeasurementHolographic testingImage processingDigital techniquesMicroelectromechanical systemsMeasurement.MicroelectronicsMeasurement.Holographic testing.Image processingDigital techniques.620.1127621.381Asundi AnandMiAaPQMiAaPQMiAaPQBOOK9910818361103321Digital holography for MEMS and microsystem metrology4017910UNINA