02521nam 2200589 a 450 991081291670332120240516085426.01-283-14818-897866131481861-84816-407-6(CKB)2550000000039671(EBL)737630(OCoLC)742333496(SSID)ssj0000630699(PQKBManifestationID)12291456(PQKBTitleCode)TC0000630699(PQKBWorkID)10747749(PQKB)10959495(MiAaPQ)EBC737630(WSP)0000P647(Au-PeEL)EBL737630(CaPaEBR)ebr10479820(CaONFJC)MIL314818(EXLCZ)99255000000003967120110712d2011 uy 0engur|n|---|||||txtccrSelected semiconductor research /Ming-Fu Li1st ed.London Imperial College Press20111 online resource (529 p.)Two columns to the page.1-84816-406-8 Includes bibliographical references.Preface; Contents; Introduction; Chapter 1. Defects in Semiconductors; Chapter 2. Semiconductor Band Structures; Chapter 3. Analog Integrated Circuit Design; Chapter 4. CMOS Device Reliability; Chapter 5. CMOS Technology; Chapter 6. Nano CMOS Device Quantum Simulation; Complete List of Publications; BiographyThis unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of: semiconductor physics and materials, including topics in deep level defects and band structures, CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. This book can be referenced by research scientists, engineers, and graduate students working in the areas of solSemiconductorsResearchNanoelectronicsResearchSemiconductorsResearch.NanoelectronicsResearch.621.3815/2Li Ming-Fu772169MiAaPQMiAaPQMiAaPQBOOK9910812916703321Selected semiconductor research4109910UNINA