01492nam 22004454a 450 991079586090332120200520144314.097801915246910191524697(MiAaPQ)EBC7034788(CKB)24235070000041(MiAaPQ)EBC430810(Au-PeEL)EBL430810(CaPaEBR)ebr10180288(CaONFJC)MIL116038(OCoLC)609831339(EXLCZ)992423507000004120060327d2006 uy 0engur|||||||||||Experimental techniques for low-temperature measurements[electronic resource] cryostat design, material properties, and superconductor critical-current testing /Jack W. EkinOxford ;New York Oxford University Press2006xxviii, 673 p. illIncludes bibliographical references and index.Low temperaturesMeasurementLow temperaturesInstrumentsLow temperature researchSuperconductorsLow temperaturesMeasurement.Low temperaturesInstruments.Low temperature research.Superconductors.536/.54Ekin J. W1277753MiAaPQMiAaPQMiAaPQ9910795860903321Experimental techniques for low-temperature measurements3846721UNINA