02058nam 22004933u 450 991045432620332120210114195029.01-281-97080-897866119708020-19-152254-6(CKB)1000000000721336(EBL)3052815(OCoLC)58832267(MiAaPQ)EBC3052815(EXLCZ)99100000000072133620160801d1999|||| u|| |engur|n|---|||||Inequality, Globalization, and World Politics[electronic resource]Oxford Oxford University Press, UK19991 online resource (366 p.)Description based upon print version of record.0-19-829567-7 Contents; Notes on Contributors; List of Figures; List of Tables; Introduction; 1. Order, Globalization, and Inequality in World Politics; 2. Globalization, Regionalization, and Inequality; 3. Sovereignty and Inequality; 4. Gender Inequality and International Human Rights Law; 5. Resources, Environmental Degradation, and Inequality; 6. Globalization, Liberalization, and Inequality: Expectations and Experience; 7. Justice and Inequality; 8. Social Policy in a Global Context; 9. Security and Inequality; Notes; Suggested Further Reading; Index; A; B; C; D; E; F; G; H; I; J; K; L; M; N; O; P; QRS; T; U; V; W; Y; ZElectronic books. -- localEquality of statesInternational relationsWorld politics -- 1989-Electronic books.Electronic books. -- local.Equality of states.International relations.World politics -- 1989-.327Hurrell Andrew292920Woods Ngaire266677AU-PeELAU-PeELAU-PeELBOOK9910454326203321Inequality, Globalization, and World Politics2200984UNINA02945oam 2200637I 450 991078872920332120200520144314.00-429-14069-X1-4200-8202-710.1201/b10415 (CKB)3390000000000075(EBL)665647(OCoLC)703152969(SSID)ssj0000469837(PQKBManifestationID)11280850(PQKBTitleCode)TC0000469837(PQKBWorkID)10531690(PQKB)10002995(MiAaPQ)EBC665647(Au-PeEL)EBL665647(CaPaEBR)ebr10447928(PPN)156181711(EXLCZ)99339000000000007520180331d2011 uy 0engur|n|---|||||txtccrHandbook of surface and nanometrology /David J. Whitehouse2nd ed.Boca Raton :CRC Press,2011.1 online resource (982 p.)Rev. ed. of: Handbook of surface metrology. c1994.A Taylor & Francis book.1-322-61470-9 1-4200-8201-9 Includes bibliographical references and index.Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back coverDavid Whitehouse, known as the father of digital metrology, helped pioneer the use of nanotechnology in surface science and surface metrology, and he continues to move the field forward. In this heavily revised and expanded edition, he addresses the many paradigm shifts occurring in the field. He explains the incorporation of physics to develop optimum solutions for manufacture and performance, and provides mechanical engineers with accessible explanations of essential concepts along with the higher mathematics that is now required of those working in the field. Emphasis is placed on systems wSurfaces (Technology)MeasurementNanostructured materialsMetrologySurfaces (Technology)Measurement.Nanostructured materials.Metrology.620/.440287Whitehouse D. J(David J.),888020Whitehouse D. J(David J.).888020MiAaPQMiAaPQMiAaPQBOOK9910788729203321Handbook of surface and nanometrology3861737UNINA