05566nam 2200673Ia 450 991078212260332120230617010654.01-281-93459-39786611934590981-279-470-0(CKB)1000000000537774(EBL)1679457(OCoLC)879074235(SSID)ssj0000232126(PQKBManifestationID)11193207(PQKBTitleCode)TC0000232126(PQKBWorkID)10227110(PQKB)11288777(MiAaPQ)EBC1679457(WSP)00005607(Au-PeEL)EBL1679457(CaPaEBR)ebr10255983(CaONFJC)MIL193459(EXLCZ)99100000000053777420060316d2004 uy 0engur|n|---|||||txtccrRadiation effects and soft errors in integrated circuits and electronic devices[electronic resource] /editors, R.D. Schrimpf, D.M. FleetwoodSingapore ;New Jersey World Scientific Pub.c20041 online resource (349 p.)Selected topics in electronics and systems ;vol. 34Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.981-238-940-7 Includes bibliographical references.CONTENTS ; Preface ; Single Event Effects in Avionics and on the Ground ; 1. Introduction ; 2. Similarities between SEE in Avionics and on the Ground ; 3. Differences Between SEE in Avionics and on the Ground ; 4. Atmospheric and Ground Level Environments ; 5. SEE Data in devices6. Summary Soft Errors in Commercial Integrated Circuits ; 1. Introduction ; 2. Scaling trends for memory devices ; 3. Seating trend for peripheral logic devices ; 4. Conclusion ; Single-Event Effects in lll-V Semiconductor Electronics ; 1. Introduction2. Single-Event Effects in lll-V Electronic Devices 3. Summary and Conclusions ; Investigation of Single-Event Transients in Fast Integrated Circuits with a Pulsed Laser ; 1. Basic Mechanisms of a SET ; 2. SET Laser Testing ; 3. Experimental set-up for SET laser testing ; 4. Results5. Conclusions System Level Single Event Upset Mitigation Strategies ; 1. Introduction ; 2. Systems Engineering for Energetic Particle Environment Compatibility ; 3. Fault Tolerant Systems Strategies ; Radiation-Tolerant Design for High Performance Mixed-Signal Circuits1. Introduction 2. Radiation Mechanisms in Mixed-Signal Integrated Circuits ; 3. Process Component and Layout Choices for Hardened-by-Design Circuits ; 4. Total Dose Hardening ; 5. Single-Event Effect Hardening ; 6. Dose-Rate Effect Hardening ; 7. ConclusionA Total-Dose Hardening-By-Design Approach for High-Speed Mixed-Signal CMOS Integrated Circuits This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes tSelected topics in electronics and systems ;vol. 34.Electronic circuitsEffect of radiation onIntegrated circuitsEffect of radiation onElectronic circuitsEffect of radiation on.Integrated circuitsEffect of radiation on.621.3815Schrimpf Ronald Donald1531970Fleetwood D. M(Dan M.)1531971MiAaPQMiAaPQMiAaPQBOOK9910782122603321Radiation effects and soft errors in integrated circuits and electronic devices3777943UNINA