02524nam 2200577 a 450 991078121100332120230725050545.01-283-14818-897866131481861-84816-407-6(CKB)2550000000039671(EBL)737630(OCoLC)742333496(SSID)ssj0000630699(PQKBManifestationID)12291456(PQKBTitleCode)TC0000630699(PQKBWorkID)10747749(PQKB)10959495(MiAaPQ)EBC737630(WSP)0000P647(Au-PeEL)EBL737630(CaPaEBR)ebr10479820(CaONFJC)MIL314818(EXLCZ)99255000000003967120110712d2011 uy 0engur|n|---|||||txtccrSelected semiconductor research[electronic resource] /Ming-Fu LiLondon Imperial College Press20111 online resource (529 p.)Two columns to the page.1-84816-406-8 Includes bibliographical references.Preface; Contents; Introduction; Chapter 1. Defects in Semiconductors; Chapter 2. Semiconductor Band Structures; Chapter 3. Analog Integrated Circuit Design; Chapter 4. CMOS Device Reliability; Chapter 5. CMOS Technology; Chapter 6. Nano CMOS Device Quantum Simulation; Complete List of Publications; BiographyThis unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of: semiconductor physics and materials, including topics in deep level defects and band structures, CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. This book can be referenced by research scientists, engineers, and graduate students working in the areas of solSemiconductorsResearchNanoelectronicsResearchSemiconductorsResearch.NanoelectronicsResearch.621.3815/2Li Ming-Fu772169MiAaPQMiAaPQMiAaPQBOOK9910781211003321Selected semiconductor research3757261UNINA