02827nam 2200625Ia 450 991077868450332120230105181652.01-118-21075-11-282-34569-997866123456920-470-50264-90-470-50262-2(CKB)1000000000822101(EBL)469502(OCoLC)476311757(SSID)ssj0000312141(PQKBManifestationID)11212350(PQKBTitleCode)TC0000312141(PQKBWorkID)10331297(PQKB)11658236(MiAaPQ)EBC469502(Au-PeEL)EBL469502(CaPaEBR)ebr10346379(CaONFJC)MIL234569(PPN)152616691(EXLCZ)99100000000082210120090210d2009 uy 0engurcn|||||||||txtccrTwo-dimensional X-ray diffraction[electronic resource] /Bob B. HeHoboken, NJ Wileyc20091 online resource (442 p.)Includes index.0-470-22722-2 TWO-DIMENSIONAL X-RAY DIFFRACTION; CONTENTS; Preface; 1. Introduction; 2. Geometry Conventions; 3. X-Ray Source and Optics; 4. X-Ray Detectors; 5. Goniometer and Sample Stages; 6. Data Treatment; 7. Phase Identification; 8. Texture Analysis; 9. Stress Measurement; 10. Small-Angle X-Ray Scattering; 11. Combinatorial Screening; 12. Quantitative Analysis; 13. Innovation and Future Development; Appendix A. Values of Commonly Used Parameters; Appendix B. Symbols; IndexWritten by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchX-raysDiffractionX-raysDiffractionExperimentsX-raysDiffractionIndustrial applicationsX-raysDiffraction.X-raysDiffractionExperiments.X-raysDiffractionIndustrial applications.539.2548.83He Bob B.1954-923808MiAaPQMiAaPQMiAaPQBOOK9910778684503321Two-dimensional X-ray diffraction2073151UNINA