01816oam 2200553 450 991071696020332120211108121337.0(CKB)5470000002526593(OCoLC)761359415(EXLCZ)99547000000252659320111115j196711 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierAutomated data collection system applied to Hall effect and resistivity measurements /by Ralph D. Thomas[Washington, D.C.] :National Aeronautics and Space Administration,[November 1967].1 online resource (25 pages) illustrationsNASA/TM ;X-1464Includes bibliographical references (page 25).Electrical resistivitynasatHall effectnasatSemiconductor devicesnasatTransport propertiesnasatCadmium sulfidesnasatCryogenic equipmentnasatData acquisitionnasatThin filmsnasatElectrical resistivity.Hall effect.Semiconductor devices.Transport properties.Cadmium sulfides.Cryogenic equipment.Data acquisition.Thin films.Thomas Ralph D.98558United States.National Aeronautics and Space Administration,OCLCEOCLCEOCLCQOCLCOOCLCQGPOBOOK9910716960203321Automated data collection system applied to Hall effect and resistivity measurements3537157UNINA